ADC HDSL4 Manual do Utilizador

Consulte online ou descarregue Manual do Utilizador para Redes ADC HDSL4. ATT-TP-000-000-006 SSTC: SSIM:: High Capacity Digital Manual do Utilizador

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ATT-TP-000-000-006
SSTC: SSIM:: High Capacity Digital Testing
To: ATT technicians that test Hi-Cap DS1 circuits
Effective Date: June, 2001
Issue Date: Issue 1, 08/25/06
Expires On: N/A
Related Documents: TR Report Number 25 - Test Patterns for DS1 Circuits,
AM-002-546-012 Ameritech High Capacity Digital Service Provisioning
Guidelines, L-780059 PB/NB Standards (Tech Pub),
ATT-TELCO-002-216-234-Job Aid -HDSL4 Deployed using ADC
Soneplex Loop Extender Chassis, Tech Support Bulletin Tab 6-67
Canceled Documents: AM-SR-NCS-000022, AM-002-546-042, TP 76625 High Capacity
Digital Service (1.544 Mb/s) Requirements and Transmission
Limits(ATT West)
Issuing Department: Network Services
Business Unit: Network
Points Of Contact: Denise Lopez, SSTC Support Staff, (913) 383-4733
Pat Wilke, SSTC Support Staff, (414-678-7702)
Author(s):
Pat Wilke
AT&T Practice ATT-TP-000-000-006
Issue 1, 08/25/06
©2006 AT&T Knowledge Ventures. All rights reserved
i
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Resumo do Conteúdo

Página 1 - ATT-TP-000-000-006

ATT-TP-000-000-006SSTC: SSIM:: High Capacity Digital TestingTo: ATT technicians that test Hi-Cap DS1 circuitsEffective Date: June, 2001Issue Date: Iss

Página 2

4.1. NCI and NC CODES TO IDENTIFY LINE CODE (AMI VS.B8ZS),FRAMING, AND IMPEDANCETable 3, below carries select NC codes. The fourth character is not in

Página 3 - 1. REASON FOR REISSUE

NOTE:For more information see Telcordia Technologies Practice BR-795-403-100.4.2. FACILITY TYPE AND LINE CODE FOR USE WITH CLFI CODEAMI or B8ZS can be

Página 4

Table 5: DefinitionsErrored Second Any one-second period containing one or more bit errors.AMI Alternate Mark Inversion is a pseudo-ternary signal con

Página 5

voltage between the two test points labeled CURRENT or VOLTAGE. The voltage should be 0.6 VDC +/- 0.03 volts toequal 60ma.NOTE:Current measurement tes

Página 6 - 3.1.2. ATT West Region

Table 7: 1 in 8 TEST PATTERN FOR B8ZS LINE CODINGPattern Average Ones Dens-ityMaximum Zeros Circuit Stressed1 in 8 (un-framed) 12.5% 7 Timing1 in 8 (f

Página 7 - 3.2. HDSL SPAN IDENTIFICATION

Table 9: ALL 1'S TEST PATTERN FOR AMI AND B8ZS LINE CODEPattern Average Ones Dens-ityMaximum Zeros Circuit StressedAll Ones (un-framed) 100% 0 Re

Página 8 - 3.2.2. ATT West

PB/NB: Tech Pub L-780059-PB/NB that is available upon customer request contains parameters from this documentfor provisioning and maintenance tests. N

Página 9 - IMPEDANCE

Table 10: AMI Standard (Non-HDSL) Spans - ProvisioningRequired Tests General Information ParametersDB Loss Test Unframed all ones pattern sent fromCO

Página 10 - B8ZS),FRAMING, AND IMPEDANCE

Table 11: AMI HDSL Span - ProvisioningRequired Tests General Information ParametersPulse (Attenuation) HDSL reading at customerpremises (This reading

Página 11 - 1 FOR TEST PARAMETERS)

•Date and time must be set.•Actual pair loss for HDSL and HDSL2 should not exceed -35 dB at 196 kHz using a 135 # termination per link orsection. This

Página 12 - INTERFACE/SMARTJACK

Table Of ContentsGeneral1. REASON FOR REISSUE12. IDENTIFYING HICAP (T1) SERVICES22.1. COMMON LANGUAGE CIRCUIT IDENTIFICATION (CLCI)22.2. COMMON LANGUA

Página 13 - Issue 1, 08/25/06

Table 12: B8ZS Standard (Non-HDSL) Spans - ProvisioningRequired Tests General Information ParametersDB Loss Test Unframed all ones pattern sent from C

Página 14

Table 13: B8ZS HDSL Spans - ProvisioningRequired Tests General Information ParametersPulse (Attenuation) HDSL card reading at customerpremises (This r

Página 15 - 5.8. BRIDGED TAP TEST

1 thirty second testSpecial Note: For Adtran HDSL2 cards used in a Litespan application. Although the Adtran card is shipped with aline code of B8ZS,

Página 16 - PROVISIONING AND MAINTENANCE

NOTE:Above tests constitute acceptable test parameters for circuit turnup in accordance with ANSI StandardT1 403 Figure 1. If these parameters are not

Página 17

Table 15: 24 Hour Test Parameters (Not a Standard Extended Test)Facility Type Errored Seconds (ES) Al-lowedSevere ErroredSeconds (SES) Al-lowedConsecu

Página 18

•Accepted by - name of person accepting service•LCON - name and phone number of Local Contact•NI A/Z - Physical location, type and position numbers of

Página 19

Automated Testing and Analysis System (ATAS) is the automated system that will populate test results in the log ofWFA/C. These test results are used f

Página 20

Table 17: AMI HDSL Span - MaintenanceRequired Tests General Information ParametersPulse (Attenuation) HDSL card reading at customerpremisesADC/Pairgai

Página 21

required test.•Actual pair loss for HDSL4 should not exceed -44 dB at 196 kHz using a 135 # termination for circuits not using aregenerator or on the

Página 22

Table 18: Maintenance Test Patterns B8ZS Line Code Standard SpansRequired Tests General Information ParametersQRSS1 five minute testtest pattern 0 err

Página 23

GeneralPurposeThis document replaces regional documents for 13 state conformity. Special Services Test Centers Managementrequested a team to update te

Página 24

Table 19: B8ZS HDSL Spans - MaintenanceRequired Tests General Information ParametersPulse (Attenuation) HDSL card reading at customerpremisesADC/Pairg

Página 25

SSTC must set the Litespan linecode to B8ZS to ensure proper line code information is set in the Litespan system linecard. The SSIM technician is not

Página 26

Figure 1: B8ZS Line Code VerificationNOTE:Do not utilize loopbacks to run this line code verification. A straight-away test is used. This test may ber

Página 27

5.0 ATAS TESTING5.1 Circuits tested by ATASATAS will grab a new report from the WFA/C trouble list when the following conditions are met:•The circuit

Página 28

Test patterns used are determined by the line coding. ATAS will run these tests depending on the linecode ATAS is checking for.AMI ATAS tests are:•QRS

Página 29

B8ZS - Binary with 8 Zero Substitution line codingBERT - Bit Error Rate TestBT - Bridged Tap - See definition in Attachment 3CART - Craft Access Remot

Página 30

PA - Pulse Attenuation - See definition in Attachment 3PM - Performance MonitoringPROCDS - TIRKS ModelQRSS - Quasi Random Signal Sequence - test patte

Página 31

•Single or multi-gauge ( 19, 22, or 24 ) cable plus bridged tap may not exceed 12 kft•HDSL2 requires that Multi-gauge containing 26-gauge cable plus b

Página 32

•38% of the units returned were found to have been subjected to a power surge. Proper grounding eliminates thisproblem.•38% of the units had no troubl

Página 33

Issue 10: 01/07/03 PMW Change AIT to SBC Midwest, SWBT to SBC Southwest, PB/NB to SBC West and SNET toSBC SNET to show correct corporate identity. Add

Página 34 - 7. Attachment 2 - Acronyms

•HX or FL•IP•SY•YB•UM2.2. COMMON LANGUAGE FACILITY IDENTIFICATION (CLFI)The Common Language Facility Identification (CLFI) is located on WFA/C screens

Página 35

Below is a portion of a WORD document containing an example of a standard span utilizing Intelligent Office Repeat-ers(IOR). Note the pair separation.

Página 36

3.2. HDSL SPAN IDENTIFICATIONSpan type identification is determined from circuit design on the WORD document. The span type is determined fromthe cust

Página 37

Table 1: Span Types ATT Midwest, ATT Southwest and ATT SNETT1S Standard span no HDSLT1SH ADC(Pairgain) HDSL no regeneratorsT1SHDNote: WFA may populate

Página 38

Table 2: ATT West Equipment CodesUsage Co Repeater NCTE at Customer EndT1 (non HDSL) KENTORB TSNPSC2ANNT1 (non HDSL) Teltrend ORBSTT TSNPSC2ANNT1 (non

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