
NOTE:
Above tests constitute acceptable test parameters for circuit turnup in accordance with ANSI Standard
T1 403 Figure 1. If these parameters are not met, the tests may be run 1 additional time. If the retest passes,
the circuit is considered acceptable for turnup. If the retest fails, sectionalization must be done to isolate the
cause of the trouble. Upon sectionalization, the above tests (span type and line code dependent) will be rerun.
PB/NB Only:
2.1 Intermittent Errors on Above Provisioning Tests
Extended tests may have to be run for test acceptance, due to intermittent errors.
Table 14: Extended Test Pattern Parameters
Test Duration and Test Errored Seconds (ES) Al-
lowed
Severe Errored
Seconds (SES) Al-
lowed
Consecutive Severe
Errored Seconds (CSES)
Allowed
5 minutes
1 in 8 (B8ZS)
3 in 24 (AMI)
All Ones (AMI and B8ZS)
0 ES 0 0
2 -15 minute QRSS (AMI and
B8ZS)
3 or less ES for each 15 minute
QRSS test
0 0
AT&T Practice ATT-TP-000-000-006
Issue 1, 08/25/06
2006 AT&T Knowledge Ventures. All rights reserved
21
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