ADC HDSL4 Manual do Utilizador descarregar pdf (Página 3)

General

Purpose

This document replaces regional documents for 13 state conformity. Special Services Test Centers Management

requested a team to update test parameters to include High-Bit-Rate Digital Subscriber Line (HDSL).

This document defines basic stress testing functions for DS1 services and testing parameters to enable the Special

Services Test Center (SSTC) tester and Special Services Installation & Maintenance (SSIM) technician to determine

which tests will be run for acceptance of new DS1 circuits.

Stress tests are used in several ways:

•

Pre-service testing to ensure that a DS1 facility meets objectives for characteristic parameters before it is turned

up for service

•

Trouble verification in response to a trouble report or indication

•

Sectionalizing confirmed faults

•

Verification of repair

The stress tests performed that pertain to installation and maintenance stress testing use specific bit patterns for AMI

and B8ZS line codes. These tests are time dependent with stipulated performance requirements of zero errors. The

testing functions described in Attachment 1 - Section 6, should be used for installation and maintenance of all 1.544

Mb/s, High-Capacity Digital Services.

Scope

An installation test on a typical circuit will require the use of these stress tests to ensure proper turn-up. For mainten-

ance, the choice of a useful sequence must be made by the tester and is dependent upon the trouble reported or an

indication of what the trouble may be. Decision logic for trouble isolation is not defined to allow the tester to choose the

next function to be performed based on previous results. Trouble isolation logic or sequence may vary by area; there-

fore, local methods and procedures should be used to perform trouble isolation and repair functions. The functions

included are intended for use in providing testing support for installation and maintenance stress tests of DS1 services.

Stress tests are applied to a circuit to identify or confirm that a circuit or facility is within acceptable test parameters.

Circuits are stressed by applying a maximum or minimum ones-density pattern, that is, all-ones signal versus a 1-in-8

signal(B8ZS)or 3 in 24(AMI).

1. REASON FOR REISSUE

Issue 12: 8/18/06 PMW - Replace Attachments 1-4 in document. Update SBC verbiage to ATT.

Issue 11: 05/06/03 PMW - Attachment 1, Section 3.0 Add H4TU-C Soneplex Tech Support Bulletin information-

Midwest Only.

AT&T Practice ATT-TP-000-000-006

Issue 1, 08/25/06

1 2 3 4 5 6 7 8 ... 37 38

Sem comentários

ADC HDSL4 Manual do Utilizador Página 3